سامانه مدیریت امور پژوهشی دانشگاه بوعلی سینا | لیلا افتخاری

	عنوان	مجله
1	Power spectral density-based fractal analysis ofsputtered yttria-stabilized zirconia thin films	SEMICONDUCTOR SCIENCE AND TECHNOLOGY
2	Crystallography characteristics of tetragonal nano-zirconia films under various oxygen partial pressure	SURFACE ENGINEERING
3	Crystallography and morphology dependence of In2O3:Sn thin films on deposition rate	SURFACE & COATINGS TECHNOLOGY