مشخصات پژوهش

عنوان	Influence of temperature and pressure on CdTe:Ag thin film
نوع پژوهش	مقاله چاپ‌شده در مجلات علمی
کلیدواژه‌ها	Thermal evaporation; cadmium telluride; hexagonal crystal system; extinction coefficient; optical band gap
چکیده	In this work, cadmium telluride (CdTe) nanoparticles-doped Ag was deposited on Ag wafer at 150°C and of 2 × 10−5 mbar. The thickness of thin films is 80 nm. The results of the XRD analysis show the formation of CdTe cubic phase and CdTe:Ag with a strong preferential orientation (220) at 150°C. The particle size in this orientation obtained about 13.00 nm. CdTe films were annealed at temperatures of 300 and 500°C and were placed under pressures of 1 × 10−4 and 6.5 × 10−4 mbar to investigate the effect of annealing and vacuum pressure changes on particle size, respectively. UV–vis measurements indicate the optical band gap for CdTe:Ag thin films is 1.75 eV and decreases with increasing the annealing temperature and pressure. Finally, to study the morphology of CdTe:Ag thin films, SEM analysis was done. The results revealed that variations of annealing temperature are more effective to increase the particle size than variations of pressure.
پژوهشگران	ابراهیم حسنی (نفر اول)، داود رئوفی (نفر دوم)