The goal of this research is to determine the effect of N2 pressure to argon pressure on the microstructural analysis and corrosion behavior of nanostructured TaN deposited coatings using a reactive DC-magnetron sputtering (RDCMS) technique. The samples coated microstructure was studied by the X-ray diffraction (XRD) and scanning electron microscope (SEM), and elemental distribution was studied using energy-dispersive X-ray spectroscopy (EDS).
