Statistical, morphological and fractal analysis of the conducting polypyrrole (PPy) thin films during polymer growth on the indium tin oxide (ITO) glass electrode were investigated. Cyclic voltammetry (CV) was used to synthesis of polymer thin films with different thicknesses and calculation of fractal dimensions (Df). Atomic force microscopy (AFM) as a powerful technique was employed to statistical study and analysis the morphology of different type of thin films surfaces with parameters such as root mean square (RMS), kurtosis (Ku), skewness (Sk) and Df. For calculating the fractal dimensions from AFM images of different thin films, power spectral density, perimeter-area and box-counting methods were used. The results show that the fractal dimensions were increase with increasing the thicknesses of the films. RMS, Ku and Sk parameters of the films were changed with increasing the film thicknesses. Moreover, X-ray diffraction (XRD) analysis technique was confirmed process of growing polymers on polycrystalline indium tin oxide (ITO) and increasing the crystallinity of PPy during film growth.
