tCadmium telluride (CdTe) thin films were prepared by RF magnetron sputtering on glass substratesat room temperature (RT). The film deposition was performed for 5, 10, and 15 min at power of 30 Wwith a frequency of 13.56 MHz. The crystal structure of the prepared CdTe thin films was studied byX-ray diffraction (XRD) technique. XRD analyses indicate that the CdTe films are polycrystalline, havingzinc blende structure of CdTe irrespective of their deposition time. All CdTe films showed a preferredorientation along (1 1 1) crystalline plane. The surface morphology characterization of the films wasstudied using atomic force microscopy (AFM). The quantitative AFM characterization shows that theRMS surface roughness of the prepared CdTe thin films increases with increasing the deposition time.The detrended fluctuation analysis (DFA) and also multifractal detrended fluctuation analysis (MFDFA)methods showed that prepared CdTe thin films have multifractal nature. The complexity, roughness ofthe CdTe thin films and strength of the multifractality increase as deposition time increases.
